Study on identifying GMAW process deviations by means of optical and electrical process data using ANN

Reisgen, Uwe; Mann, Samuel Micha (Corresponding author); Oster, Lukas Emmanuel; Gött, G.; Sharma, Rahul; Uhrlandt, Dirk

Piscataway, NJ / IEEE (2020) [Contribution to a book, Contribution to a conference proceedings]

2020 IEEE 16th International Conference on Automation Science and Engineering (CASE) / publisher: IEEE
Page(s): 1594-1599

Identifier